Design and performance of a programmable-temperature scanning tunneling microscope
نویسندگان
چکیده
منابع مشابه
Design considerations and performance of a combined scanning tunneling and scanning electron microscope
We designed and built a combination of a scanning tunneling microscope ~STM! and a scanning electron microscope ~SEM! which is working under ultrahigh vacuum conditions ~base pressure typically 7 • 10 mbar!. The SEM is ideally used for surveying the sample and to control the STM tip positioning, while the STM extends the resolution range into the atomic scale. The design concept allows moving t...
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JacobTosado July 22, 2004 This paper discusses work I have done with the construction of a low temperature scanning tunneling microscope (LTSTM) and the operation of a scanning tunneling microscope (STM). A brief description to why a LTSTM is used and the background concerning that description, is covered. Mainly methods in STM imaging are described giving insight into two possible sources of i...
متن کاملDesign and Construction of a Scanning Tunneling Microscope
This report describes the design and construction of a Scanning Tunneling Microscope (STM). A Scanning Tunneling Microscope is a relatively new instrument in the field of surface science and has the capability of atomic resolution of surfaces. This report presents some background theory pertinent to the understanding of the STM. Theories of electron tunnefing, STM operation, and control theory ...
متن کاملNew design of a variable-temperature ultrahigh vacuum scanning tunneling microscope
We present the design of a variable-temperature ultrahigh vacuum ~UHV! scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1998
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1148901